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Roy Stuart Glimpse Vol 1 Roy Avil


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NBISP has developed a Scanning Electron Microscope (SEM) for the analysis of Relay HCLM . In order to achieve high accuracy of the HCLM, a high-voltage (>250V) e-beam microscope constructed in our university was newly applied. The present apparatus is composed of SEM, automatic focusing, observing, and contrast control. This apparatus can also be used to observe any samples (biological and non-biological) and iron/plasma spraying. It is a one-step ABS (Acryl-based hot melt adhesives) sealing mechanism using EB to bond two plastic pieces to each other. During the bonding, the ABS resin is rapidly cured to a substrate with a very low temperature ( d2c66b5586






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